Effect of Underlap on 30 nm Gate Length FinFET Based LNA Using TCAD Simulations

نویسندگان

  • Qiuting Huang
  • Francesco Piazza
  • Bernhard SCHMITHUSEN
  • Andreas SCHENK
  • Andreas WETTSTEIN
  • Axel ERLEBACH
  • Simon BRUGGER
  • Yuhua Cheng
چکیده

The effect of gate – drain/source underlap ( Lun ) on a narrow band LNA performance has been studied , in 30 nm FinFET using device and mixed mode simulations. Studies are done by maintaining and not maintaining the leakage current (Ioff) of the various devices. LNA circuit with two transistors in a cascode arrangement is constructed and the input impedance, gain and noise-figure have been used as performance metrics. To get the better noise performance and

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تاریخ انتشار 2017